Simcenter PowerTester

Simcenter POWERTESTER 600A – Demonstration

A video demonstration of the Simcenter POWERTESTER 600A 16C 18V product version for power semiconductor thermal reliability and lifetime testing (IGBTs, Si and SiC MOSFETs, Diodes, etc). Simcenter POWERTESTERs combine power cycling and thermal characterization to serve power electronics applications. Thermal transient measurement based Structure Functions are sampled during power cycling to identify degradation in the package thermal structure and indicate failure root causes.

Simcenter POWERTESTER 1800A – Demonstration

A video demonstration of the Simcenter POWERTESTER 1800A 12C 12V product version for power semiconductor thermal reliability and lifetime testing (IGBTs, Si and SiC MOSFETs, Diodes, etc). Simcenter POWERTESTERs combine power cycling and thermal characterization to serve power electronics applications. Thermal transient measurement based Structure Functions are sampled during power cycling to identify degradation in the package thermal structure and indicate failure root causes.

The Simcenter POWERTESTER 1800A 12C 12V includes 2 cold plates, universal fixture and chiller control. It is also an option to use customer’s own cold-plate or water jacket connection.

Simcenter POWERTESTER 2400A – Demonstration

A video demonstration of the Simcenter POWERTESTER 2400A 16C 12V product version for power semiconductor thermal reliability and lifetime testing (IGBTs, Si and SiC MOSFETs, Diodes, etc). Simcenter POWERTESTERs combine power cycling and thermal characterization to serve power electronics applications. Thermal transient measurement based Structure Functions are sampled during power cycling to identify degradation in the package thermal structure and failure root causes.

Simcenter POWERTESTER power electronics component thermal reliability testing – Video

This introductory video discusses how Simcenter POWERTESTER test hardware range is used in power electronics applications for power semiconductor thermal reliability and lifetime assessment (IGBTs, Si and SiC MOSFETs, Diodes, etc). Simcenter POWERTESTER products combine automatic power cycling and thermal characterization measurement for failure diagnosis. Structure Functions are sampled during power cycling, without removal of the device under test, to indicate thermal degradation in a component thermal structure to provide useful insight into root causes of failure.